XVIII IMEKO WORLD CONGRESS Metrology for a Sustainable Development September, 17–22, 2006, Rio de Janeiro, Brazil ULTRASOUND MICROSCOPY TECHNIQUES TO DETECT DELAMINATION IN STACKED LAYERS

نویسندگان

  • Stefan Johann Rupitsch
  • Bernhard Günther Zagar
چکیده

We present the theory and some applications of the synthetic aperture focusing technique applied to single transducer ultrasonic data sets. In this technique a virtual source located at the geometrical focal point of the physical transducer is algorithmically generated and thus allows for tighter focusing over a geometrically larger scan volume. We present results from a structural test phantom (two copper wires) and a delaminated specimen.

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تاریخ انتشار 2006